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References

1
See for instance CMS: C.J. Seez, Nucl. Instr. and Meth. A344 (1994) 1.

2
R. Brun et al., GEANT Detector Description and Simulation Tool, CERN Program Library, W5013, 1994.

3
N. Høimyr, J. Vuoskoski, Transfer of Physics Detector Models into Computer Aided Design Systems, (accepted for publication in Nucl. Instr. and Meth).

4
M. E. Mortenson, Geometric Modeling, John Wiley & Sons, Inc., 1985.

5
M. Mäntylä, An Introduction to Solid Modeling, Computer Science Press, 1988.

6
E. G. Schlechtendahl (editor), CAD Data Transfer for Solid Models, ESPRIT Research Reports, Project 322, CAD Interfaces, Volume 3, Springer-Verlag, 1989.

7
J. Ahvenainen, T. Oksakivi, J. Vuoskoski, Modelling Physics Detectors in a Computer Aided Design System for Simulation Purposes, (accepted for publication in Nucl. Instr. and Meth).

8
ISO 10303, Industrial Automation Systems and Integration - Product Data Representation and Exchange - Part 1: Overview and Fundamental Principles, ISO TC 184/SC4, 1992.

9
J. Owen, STEP: An Introduction, Information Geometers Ltd, 1994.

10
ISO 10303, Industrial Automation Systems and Integration - Product Data Representation and Exchange - Part 21: Clear Text Encoding of the Exchange Structure, ISO TC 184/SC4, 1992.

11
A. Dellacqua et al., GEANT 4: an Object-Oriented toolkit for simulation in HEP, CERN/DRDC/P58, 1994.

12
R. Bartels, J. Beatty, B. Barsky, An Introduction to SPLINES for use in Computer Graphics & Geometric Modeling, Morgan Kaufmann, 1987.

13
A. Rockwood, K. Heaton, T. Davis, Real-Time Rendering of Trimmed Surfaces, Computer Graphics, 23, 3 (1989) 107-117.

14
T. Dokken, Finding Intersections of B-Spline Represented Geometries Using Recursive Subdivision Techniques, Computer Aided Geometric Design, 2, 1/3 (1985) 189-195.

15
T. Nishita, T. Sederberg, M. Kakimoto: Ray Tracing Trimmed Rational Surface Patches, Computer Graphics, 24, 4, (1990) 337-345.

16
M. Sweeney, R. Bartels: Ray Tracing Free-Form B-Spline Surfaces, IEEE Computer Graphics and Applications, Vol. 6, No. 2, (1986), 41-49.

17
D. Toth: On Ray Tracing Parametric Surfaces, Computer Graphics, Vol. 19, No. 3, (1985), 171-179.

18
K. Joy, M. Bhetanabhotla: Ray Tracing Parametric Surface Pathces Utilizing Numerical Techniques and Ray Coherence, Computer Graphics, Vol. 20, No. 4, (1986), 279-286.

19
J. Kajiya: Ray Tracing Parametric Patches, Computer Graphics, Vol. 16, No. 3, (1982) 245-254.

20
ISO 10303, Industrial Automation Systems and Integration - Product Data Representation and Exchange - Part 11: Description Methods: The EXPRESS Language Reference Manual, ISO TC 184/SC4, 1992.

21
D. A. Schenck, P. R. Wilson, Information Modeling: The EXPRESS way, Oxford University Press, 1994.

22
ISO 10303, Industrial Automation Systems and Integration - Product Data Representation and Exchange - Application Protocol 203: Configuration Controlled Design, ISO TC 184/SC4, 1992.

23
Y. Liang, B. Barsky, A New Concept and Method for Line Clipping, ACM Transactions on Graphics, 3, 1 (1984) 1-22.

24
J. Rumbaugh et. al., Object-Oriented Modeling and Design, Prentice-Hall, Inc., 1991.

25
K. Weiskamp and B. Flaming, The Complete C++ Primer, Academic Press, Inc., 1992.

26
K.C. Morris, D. Sauder, S. Ressler, Validation Testing System: Reusable Software Component Design, National Institute of Standards and Technology, Gaithersburg, MD, NISTIR 4937, 1992.

27
S.N. Clark, D. Libes, Fed-X: The NIST Express Translator, National Institute of Standards and Technology, Gaithersburg, MD, NISTIR 4822, 1992.

28
M. Dach, N. Høimyr, J. Saarela, J. Vuoskoski, Applying STEP Principles to Product Models in High Energy Physics Research, Helsinki University of Technology, Finland, Report TKK-F-A724, 1994.

29
SISL, the SI Spline Library, version 3.0, Reference Manual, SINTEF, Norway, 1992.

30
GHL, Geometry Handling Library, version 2.3.2, Function list, Precision Modeling Laboratory, Japan, 1994.

31
T. Rando, L. McCabe, Issues in implementing the C++ binding to SDAI, Computer Standards & Interfaces, 16 (1994) 331-340.



jvuoskos@dxcern.cern.ch 5/95